1995 IEEE Conference on Lasers and Electro-Optics by IEEE Lasers & Electro-Optics Society PDF

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By IEEE Lasers & Electro-Optics Society

ISBN-10: 1559374004

ISBN-13: 9781559374002

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Extra resources for 1995 IEEE Conference on Lasers and Electro-Optics

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The transient overvoltage factor shall be calculated by dividing the peak transient voltage by the line-to-ground peak value of the average of the open and closed circuit test voltage. 8). i) For circuit breakers rated for instantaneous reclosing, these operations are to be made with a duty of Open - 0 s Close to demonstrate the circuit breaker’s capability during high-speed reclosing when the unfaulted phases of a line may have a trapped voltage charge. 04-1999). j) If tests are made with lumped capacitor banks to simulate transmission lines or cables, the test circuit may be modified to limit current surges on closing to those obtained when closing into the surge impedance of a line or cable.

04-1999, depending on the type of capacitance current switching test being made. During single-phase tests, the test circuit may be grounded. When single-phase tests are made on a circuit breaker with the three poles in one tank, the other poles shall be grounded. 9 Reversal of test connections On circuit breakers that have unsymmetrical insulation paths, the connections to the source and to the capacitive load shall be reversed for half of the 100% capacitance current switching tests listed in Table 3 and Table 4.

All rights reserved. 09-1999 b) IEEE STANDARD TEST PROCEDURE FOR AC HIGH-VOLTAGE 1) 3 to 7% of the rated continuous current; and 2) 95 to 100% of the rated continuous current. The power factor of the test circuits shall be 80% lagging or less with a parallel connected load. NOTE—Tests at lower power factors are not required but may be made at the option of the manufacturer. c) d) e) f) g) For three-phase tests, three close-open operations shall be made at each current level. For singlephase tests, nine close-open operations shall be made at each current level with the contact parting time to be varied by 30° intervals, on one reference phase, between tests.

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1995 IEEE Conference on Lasers and Electro-Optics by IEEE Lasers & Electro-Optics Society

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